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Measurement of Annealing Phenomena in High Purity Metals with Near-field High Energy X-ray Diffraction Microscopy
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- Measurement of Annealing Phenomena in High Purity Metals with Near-field High Energy X-ray Diffraction Microscopy
Publication Information:
Hefferan, C.M., Measurement of Annealing Phenomena in High Purity Metals with Near-field High Energy X-ray Diffraction Microscopy, PhD Thesis, 2012, Carnegie Mellon University.
Year: 2012