Microstructure Geometry and Topology Tracking Using High Energy X-Ray Diffraction Microscopy

Publication Information:

Li, S.F., B.W. Reed, J.V. Bernier, M.Kumar, J.Lind, C.M. Hefferan, R.M. Suter and U. Lienert, Microstructure Geometry and Topology Tracking Using High Energy X-Ray Diffraction Microscopy, Presented at MRS 2012, 2012, Boston, MA.

Year: 2012