Pokharel, R., S.F. Li, J. Lind, C.M. Hefferan, U. Lienert, R.A. Lebensohn, R.M. Suter and A.D. Rollett, “Quantifying Damage Accumulation Using State-of-The-Art FFT Method”, Materials Science Forum, Vol. 702, pp. 515-518, 2012. DOI: 10.4028/www.scientific.net/MSF.702-703.515
A 3D microstructure, measured by high-energy x-ray diffraction microscopy, is used as an input to a parallelized viscoplastic Fast Fourier Transform code (VPFFT) to simulate a tensile test. Distributions of strain, damage accumulation, neighbor interactions, and Schmid factor mismatch throughout the microstructure are calculated. These results will form the basis of a direct comparison to microstructure maps that track plastic deformation in the real sample.