Recovery and Recrystallization in High Purity Aluminum Using Near-field High Energy X-ray Diffraction Microscopy

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Publication Information:

Hefferan, C.M., J.Lind, S.F. Li, U. Lienert, A.D. Rollett and R.M. Suter, Recovery and Recrystallization in High Purity Aluminum Using Near-field High Energy X-ray Diffraction Microscopy, Presented at MS&T 2012, 2012, Pittsburgh, PA.

Year: 2012