Strohmeier, B.R., K.L. Bunker, C.L. Lopano, J.P. Marquis, Jr., J.D. Piasecki, K.E. Bennethum, R.G. White, T.S. Nunney and R.J. Lee, XPS and SEM/STEM Characterization of Silver Nanoparticles Formed from the X-ray-Induced and Thermal Reduction of Silver Behenate, presented at Microscopy and Microanalysis Annual Meeting, July 2009, Richmond, VA, and presented at the American Vacuum Society 56th International Symposium and Exposition San Jose, TX, 2009, Richmond, VA.