State-of-the-Art Instrumentation from Hitachi

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  • 8:28AM Oct 01, 2009
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RJ Lee Group has added several pieces of instrumentation to its collection of high-end analytical equipment, including the Hitachi HD-2300 field emission scanning transmission electron microscope (FE-STEM). The HD-2300 200kV FE-STEM is the newest high resolution, high throughput STEM/SEM designed for quick, comprehensive sample evaluation, with unmatched analytical capabilities and consistent high-end performance with the […]

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