quality control testing
Contamination in Current Manufacturing Processes
RJ Lee Group’s instrumentation provides the analytical flexibility and precision needed to investigate and identify foreign particulate matter and defects. Our scientists provide the operational skill and analytical expertise required with a range of investigative techniques including:
- Contamination Identification
- Source Determination and Root Cause Analysis
- Particle Sizing and Counting
- Data basing of Process Materials for a Proactive FPM Program
- Raw Materials Testing and Product Sampling
- ID of Glass Delamination and Other Failures
- Metallurgy and Manufacturing-Associated Defects
- Investigative Chemistry
- Nondestructive Testing and Evaluation for Microelectronics
- Nanocharacterization Including Coatings and Pharmaceuticals
Automated Particle Analysis
Contaminants of varying chemistry and morphology may impact product quality in any sample, in any part of the manufacturing process. Computer-controlled scanning electron microscopy (CCSEM) allows for unattended measurement analysis when testing large sample quantities or large areas, such as in steel production. CCSEM quickly provides size, shape and chemistry/composition, and reports the results in a clear, easy-to-understand manner.