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Silicon Wafer Manufacturing Stress and Defects

Problems with Silicon Wafer Stress? Raman Can Help Identify and Prevent Processing Defects

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  • 2:40AM Feb 21, 2014
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As a silicon wafer manufacturer, you are faced with pressure to increase yield and speed up the manufacturing process—all while maintaining your product’s quality. Altering even minor processing parameters can generate stress on a wafer’s crystal lattice leading to an increased number of damaged or defective devices on a given wafer. Because most strain patterns […]

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