Archives

Exploring the Merit of Non-Destructive nf-HEDM in Characterizing Textured Materials

Post by:
  • 1:57PM Sep 26, 2014
  • Comments off

In his presentation at the 8th International Symposium on Superalloy 718 and Derivatives on Wednesday, October 1, 2014 at the 10:00 AM in the Marquis Ballroom of the Marriott City Center in Pittsburgh, PA, Dr. Chris Hefferan will describe an OIM technology, near-field High Energy X-ray Diffraction Microscopy (nf-HEDM), that enables a new way of […]

Read More